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Thickness effect on scaling law and surface properties of nano-dimensional SnTe thin films.
Publication Type: Academic Journal
Source(s): Journal of Applied Physics; 11/7/2021, Vol. 130 Issue 17, p1-11, 11p
Abstract: Copyright of Journal of Applied Physics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users ma...
Investigation of radiation damage using thermal spike model for SHI irradiation on Al2O3.
Publication Type: Academic Journal
Source(s): Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena; May/Jun2022, Vol. 177 Issue 5/6, p513-530, 18p
Abstract: Copyright of Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright ...
Raman and RBS Analysis of Silicon Ion Implanted Gallium Arsenide.
Publication Type: Academic Journal
Source(s): International Journal of Nanoscience; Feb2022, Vol. 21 Issue 1, p1-5, 5p
Abstract: Copyright of International Journal of Nanoscience is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. H...
Modification of Semi Insulating GaAs sample Implanted with Silicon Negative Ion.
Publication Type: Conference
Source(s): AIP Conference Proceedings; 2020, Vol. 2220 Issue 1, p040028-1-040028-4, 4p, 2 Graphs
Abstract: Copyright of AIP Conference Proceedings is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users ma...
Characterization of 100 keV Silicon Negative Ion Implanted SiO2 Thin Films.
Publication Type: Conference
Source(s): AIP Conference Proceedings; 2020, Vol. 2220 Issue 1, p020180-1-020180-4, 4p, 1 Chart, 2 Graphs
Abstract: Copyright of AIP Conference Proceedings is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users ma...
Silicon negative ion implantation induced vacancy defects in thermally grown SiO2 thin films.
Publication Type: Academic Journal
Source(s): Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena; Jul/Aug2020, Vol. 175 Issue 7/8, p695-703, 9p
Abstract: Copyright of Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright ...
Intersubband Absorption in Gallium Arsenide Implanted with Silicon Negative Ions.
Publication Type: Academic Journal
Source(s): International Journal of Nanoscience; Jun2020, Vol. 19 Issue 3, pN.PAG-N.PAG, 7p
Abstract: Copyright of International Journal of Nanoscience is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. H...
Micro-Raman study on the softening and stiffening of phonons in rutile titanium dioxide film: Competing effects of structural defects, crystallite size, and lattice strain.
Publication Type: Academic Journal
Source(s): Journal of Applied Physics; 2014, Vol. 115 Issue 14, p143504-1-143504-5, 5p, 1 Black and White Photograph, 4 Graphs
Abstract: Copyright of Journal of Applied Physics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users ma...
Crystallization of Ge in ion-irradiated amorphous-Ge/Au thin films.
Publication Type: Academic Journal
Source(s): CrystEngComm; 1/28/2020, Vol. 22 Issue 4, p666-677, 12p
Abstract: Copyright of CrystEngComm is the property of Royal Society of Chemistry and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download...
Fractal characterizations of energetic Si ions irradiated amorphized‐Si surfaces.
Publication Type: Academic Journal
Source(s): Surface & Interface Analysis: SIA; Aug2019, Vol. 51 Issue 8, p817-825, 9p
Abstract: Copyright of Surface & Interface Analysis: SIA is the property of John Wiley & Sons, Inc. and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users m...