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Advanced Search Results For "SEMICONDUCTOR manufacturing"

1 - 10 of 17,551 results for
 "SEMICONDUCTOR manufacturing"
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A global scheduling approach for cycle time control in complex manufacturing systems.

Publication Type: Academic Journal

Source(s): International Journal of Production Research. Jan2023, Vol. 61 Issue 2, p559-579. 21p. 7 Diagrams, 19 Charts.

Abstract: This paper proposes a novel global scheduling approach for cycle time control strategy in large complex manufacturing systems with multiple workcentres, such as semiconductor manufacturing systems. The interaction between workcentres is taken into acco...

A job-priority based soft scheduling approach for uncertain work area scheduling in Semiconductor Manufacturing.

Publication Type: Academic Journal

Source(s): International Journal of Production Research. Aug2022, Vol. 60 Issue 16, p5012-5028. 17p.

Abstract: This paper studies the uncertain scheduling problem of the oxidation/deposition/diffusion work area in semiconductor manufacturing, where fluctuations in arrival times and processing times are considered. To overcome the shortcomings of the conventiona...

Efficient scheduling approaches to time-constrained single-armed cluster tools with condition-based chamber cleaning operations.

Publication Type: Academic Journal

Source(s): International Journal of Production Research. Jun2022, Vol. 60 Issue 11, p3555-3568. 14p. 2 Color Photographs, 1 Chart, 1 Graph.

Abstract: In semiconductor manufacturing, an extremely stringent quality control is enforced for wafer fabrication processes. Consequently, cleaning operations that clear residual chemical gases and heat in the chambers are frequently performed. As one kind of c...

Finite-Time Attitude Tracking Control for Hypersonic Flight Vehicles with Actuator Saturation.

Publication Type: Academic Journal

Source(s): International Journal of Aerospace Engineering. 11/23/2022, p1-15. 15p.

Abstract: This paper investigates finite-time attitude tracking control strategies for hypersonic flight vehicles (HFVs) with parameter uncertainties, external disturbances, and actuator saturations by applying sliding model control, adaptive mechanism, and nonl...

Optimization of Voltage Dynamic Performance at Inverter Output with Machine Learning and Intelligent Virtual Impedance.

Publication Type: Academic Journal

Source(s): Mobile Information Systems. 8/17/2022, p1-13. 13p.

Authors:

Abstract: With the continuous improvement of industrial production and manufacturing level, all kinds of equipment are developing in the direction of refinement and precision, especially the equipment manufacturing industry such as automobile manufacturing, equi...

An On-Chip Planar Inverted-F Antenna at 38 GHz for 5G Communication Applications.

Publication Type: Academic Journal

Source(s): International Journal of Antennas & Propagation. 7/21/2022, p1-7. 7p.

Abstract: This paper presents an on-chip planar inverted-F antenna (PIFA) implemented in TSMC 180 nm CMOS process technology. The antenna operates at a 5 G millimeter-wave center frequency of 38 GHz. The ultrathick metal (UTM) layer of the technology is utilized...

Perspectives on field-free spin–orbit torque devices for memory and computing applications.

Publication Type: Academic Journal

Source(s): Journal of Applied Physics; 1/28/2023, Vol. 133 Issue 4, p1-13, 13p

Abstract: Copyright of Journal of Applied Physics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users ma...

An Evolutionary Normalization Algorithm for Signed Floating-Point Multiply-Accumulate Operation.

Publication Type: Academic Journal

Source(s): Computers, Materials & Continua. 2022, Vol. 72 Issue 1, p481-495. 15p.

Abstract: In the era of digital signal processing, like graphics and computation systems, multiplication-accumulation is one of the prime operations. A MAC unit is a vital component of a digital system, like different Fast Fourier Transform (FFT) algorithms, con...

Prediction of highly imbalanced semiconductor chip-level defects using uncertainty-based adaptive margin learning.

Publication Type: Academic Journal

Source(s): IISE Transactions. Feb2023, Vol. 55 Issue 2, p147-155. 9p.

Abstract: In semiconductor manufacturing, the package test is a process that verifies whether the product specifications are satisfied before the semiconductor products are finally shipped to customers. The packaged chips are classified as good or defective acco...

Learning per-machine linear dispatching rule for heterogeneous multi-machines control.

Publication Type: Academic Journal

Source(s): International Journal of Production Research; Jan 2023, Vol. 61 Issue 1, p162-182, 21p, 4 Diagrams, 11 Charts, 3 Graphs

Abstract: Copyright of International Journal of Production Research is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However,...

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